VLSI Design Methodologies Considering Fabrication Variability

Speaker Professor Shrivastava 
Department of Electrical and Computer Engineering
University of Maryland
CECS Host Professor Elaheh Bozorgzadeh
Location IERF Conference Room 127
Date & Time June 9, 2005
Refreshments at 2:30pm, Lecture begins at 3:00pm
Abstract In the past few years, it has become clear that fabrication variability is one of the most important challenge that needs to be addressed for keeping the semiconductor industry profitable. Fabrication variability imposes an underlying uncertainty on the design process of VLSI chips making several parameters random. Therefore, the old way of doing design needs to be overhauled for considering this randomness. This implies that VLSI CAD needs to incorporate probabilistic models for capturing uncertainty and stochastic optimization for controlling the design decision variables. Several challenges need to be addressed before this is made possible…

Ankur Srivastava received the B.S. degree from the Indian Institute of Technology, Delhi, the M.S. degree from Northwestern University, Evanston, IL, and the Ph.D. degree from the University of California Los Angeles (UCLA) in 1998, 2000, and 2002. Since fall 2002 he has been an Assistant Professor with the University of Maryland, College Park. His research interests include all aspects of design automation including logic and high-level synthesis, low-power issues and predictability, and low-power issues pertaining to sensor networks. Dr. Srivastava received the outstanding Ph.D. Award from the Computer Science Department of UCLA in 2002. He is a member of ACM and IEEE.