Sunghoon Chun, Alex Orailoglu: DiSC: A New Diagnosis Method for Multiple Scan Chain Failures. IEEE Trans. on CAD of Integrated Circuits and Systems 29(12): 2051-2055 (2010)
Sunghoon Chun, Alex Orailoglu: DiSC: A New Diagnosis Method for Multiple Scan Chain Failures. IEEE Trans. on CAD of Integrated Circuits and Systems 29(12): 2051-2055 (2010)