IEEE International Symposium on Quality Electronic Design (ISQED 2008) – March 17-19, 2008

Location: San Jose, CA
Website: http://www.isqed.org/

A. Gupta, F. Kurdahi, N. Dutt, K. Khouri, M. Abadir.,   “Thermal Aware Global Routing of VLSI Chips for Enhanced Reliability,” Proceedings of ISQED 2008, March 2008.