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Design, Automation, and Test in Europe Conference (DATE ‘03)

F. Doucet, R. Gupta, and S. Shukla, “Introspection in System-Level Language Frameworks: Meta-Level or Integrated,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 382-387, Munich, Germany, March 2003 download pdf

A. Gerstlauer, H. Yu, and D. Gajski, “RTOS Modeling for System Level Design,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 130-135, Munich, Germany, March 2003 download pdf

A. Ghosh and T. Givargis, “Analytical Design Space Exploration of Caches for Embedded Systems,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 650-655, Munich, Germany, March 2003 download pdf

S. Gupta, N. Dutt, R. Gupta, and A. Nicolau, “Dynamic Conditional Branch Balancing During the High-Level Synthesis of Control-Intensive Designs,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 270-275, Munich, Germany, March 2003 download pdf

M. Mamidipaka and N. Dutt, “On-Chip Stack Based Memory Organization for Low Power Embedded Architectures,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 1082-1087, Munich, Germany, March 2003 download pdf

D. Nicolaescu, A. Veidenbaum, and A. Nicolau, “Reducing Power Consumption for High-Associativity Data Caches in Embedded Processors,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 1064-1068, Munich, Germany, March 2003 download pdf

C. Pan, N. Bagherzadeh, A. Kamalizad, and A. Koohi, “Design and Analysis of a Programmable Single-Chip Architecture for DVB-T Base-Band Receiver,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 468-473, Munich, Germany, March 2003 download pdf

P. Petrov and A. Orailoglu, “Power Efficiency Through Application-Specific Instruction Memory Transformations,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 30-35, Munich, Germany, March 2003 download pdf

W. Roa and A. Orailoglu, “Virtual Compression Through Test Vector Switching for Scan Based Design,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 104-109, Munich, Germany, March 2003 download pdf

M. Sánchez-Élez, M. Férnandez, M. Anido, H. Du, N. Bagherzadeh, and R. Hermida, “Low Energy Data Management for Different On-Chip Memory Levels in Multi-Context Reconfigurable Architectures,” Design, Automation, and Test in Europe Conference (DATE ‘03), pp 36-41, Munich, Germany, March 2003
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Z. Zeng, Q. Zhang, I. G. Harris, and M. Ciesielski, “Fast Computation of Data Correlation Using BDDs,” IEEE/ACM Design Automation and Test in Europe Conference (DATE ’03), Munich, Germany, March 2003 download pdf