Overview of Seminar by Dr. Sani R. Nassif

Why Circuits Fail
 

Speaker

 

Dr. Sani R. Nassif
IBM Austin Research Labs

       
 

CECS Host

 

Professor Fadi Kurdahi

       
 

Location

 

Donal Bren Hall (DBH) 3011

       
 

Date & Time

 

November 10 , 2009
Refreshments at 1:30 pm, Lecture begins at 2:00 pm

       
 

Abstract

  We live in a world where we increasingly depend on the electronic systems that surround us. What used to be in computers is now in our phones, cars, appliances, and even in greeting cards. We expect these systems to "just work". This talk will explore how the underlying CMOS circuits from which we build all these systems can fail, under what conditions -both internal and external, and what these failure trends look like for the future. The hope is that it will motivate students to look at alternative approached for circuit resilience.
       
 

Biography

 

Sani R. Nassif Sani received his PhD from Carnegie-Mellon university in the eighties. He worked for ten years at Bell Laboratories on various aspects of design and technology coupling including device modeling, parameter extraction, worst case analysis, design optimization and circuit simulation. He joined the IBM Austin Research Laboratory in 1996 where he is presently managing the tools and technology department, a bunch of eclectic individuals doing research on such diverse areas as formal verification, timing simulation and analysis, testing, low power design and thermo-electric cooling. He is a Fellow of the IEEE and a member of the IBM Academy of Technology.

   

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