Professor Rainer Doemer’s paper entitled “May-Happen-in-Parallel Analysis based on Segment Graphs for Safe ESL Models” has received the Best Paper Award at the Design, Automation and Test in Europe (DATE) conference this year. The paper was selected out of a record number of over 1000 submissions. DATE is the top conference for embedded system design – more information can be found at the this link:
949-824-9127
