CECS Seminar Series

Title:  “Mitigating BTI-induced Device Degradation: A Circuit and System Persepctive”

Speaker: Prof. Ing-Chao Lin, National Cheng Kung University, Taiwan

Date and Time: Monday, February 8, 2016 at 1:30 p.m.

Location: Donald Bren Hall 3011

Host:  Professor Nikil Dutt

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